Characterizing a texture of an image
US8208698B2 · kind B2 · utility
22Cited by
10References
54Claims
0Family size
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Key dates
| Filing date | Dec 14, 2007 |
| Grant date | Jun 26, 2012 |
| Priority date | — |
| Expiry date | Apr 25, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30088
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Among other things, a texture of an image is characterized by deriving lacunarity measures from the image based on a wavelet analysis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.