In-line process measurement systems and methods
US8212216B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 27, 2008 |
| Grant date | Jul 3, 2012 |
| Priority date | — |
| Expiry date | Sep 11, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/151
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of using multivariate optical computing in real-time to collect instantaneous data about a process stream includes installing an optical analysis system proximate a process line, the process line being configured to move a material past a window of the optical analysis system; illuminating a portion of the material with a light from the optical analysis system; directing the light carrying information about the portion through at least one multivariate optical element in the optical analysis system to produce an instantaneous measurement result about the portion; and continuously averaging the instantaneous measurement result over a period of time to determine an overall measurement signal of the material.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.