Defective emitter detection for electroluminescent display
US8212581B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 30, 2009 |
| Grant date | Jul 3, 2012 |
| Priority date | — |
| Expiry date | Oct 13, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2330/12
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Inoperative or defective electroluminescent (EL) emitters in an EL display having a plurality of subpixels are detected. Current flow through a drive transistor in a subpixel is turned off, a selected test current is provided through the EL emitter in the subpixel using a current source, and the voltage at a second electrode of a readout transistor in the subpixel is measured to provide a status signal representative or characteristics of the selected EL emitter. The status signal for the subpixel is compared to the respective status signals of neighboring subpixels to determine whether the EL emitter in the subpixel is defective.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.