Patent · US Active

Metric for planned downtime

US8212683B2 · kind B2 · utility

11Cited by

1References

20Claims

0Family size

Assignee

SAP AG · DE

Inventors

Udo Klein · Maximiliansau, DE
Herbert Stegmueller · Bruchsal, DE

Key dates

Filing date	Dec 9, 2009
Grant date	Jul 3, 2012
Priority date	—
Expiry date	Dec 17, 2030

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/3093
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A metric of a system is monitored using a monitoring tool that receives an operation metric and a planned downtime metric that reflects whether the monitored system is currently in a planned downtime, the planned downtime metric received as another one of the multiple metric inputs. The operation metric and the planned downtime metric are combined into a processed operation metric for the monitored system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.