Patent · US Active

Method and apparatus for surveying actual measurement data of a component

US8212993B2 · kind B2 · utility

6Cited by

0References

20Claims

0Family size

Assignee

STEINBICHLER OPTOTECHNIK GMBH · DE

Inventors

Matthia Prams · Raubling, DE
Michael Gandyra · Rosenheim, DE
Roman Apanovich · Kolbermoor, DE

Key dates

Filing date	Jul 23, 2008
Grant date	Jul 3, 2012
Priority date	—
Expiry date	Aug 28, 2029

Classification

Technology area (CPC G)Physics
CPC primaryG01B21/042
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An improved method for surveying actual measurement data of a component, which originate from an optical scan, is characterized in that the actual measurement data (2) of the component (1) are surveyed by means of a measurement program (24) for a tactile coordinate measuring instrument, wherein the measurement program (24) generates a virtual measuring stylus of a virtual coordinate measuring instrument, which surveys the actual measurement data of the component.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.