Patent · US Active

System and method for 3D measurement and surface reconstruction

US8213707B2 · kind B2 · utility

97Cited by

1References

36Claims

0Family size

Assignee

CITY UNIVERSITY OF HONG KONG · CN

Inventors

You Li · Nanhu, CN
Sheng CHEN · Tongji, CN

Key dates

Filing date	Nov 12, 2008
Grant date	Jul 3, 2012
Priority date	—
Expiry date	Nov 12, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG06T17/10
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A system and method for measuring and surface reconstruction of a 3D image of an object comprises a projector arranged to project a pattern onto a surface of an object to be imaged; and a processor stage arranged to examine distortion or distortions produced in the pattern by the surface. The processor stage is arranged to convert by, for example, a triangulation process the distortion or distortions produced in the pattern by the surface to a distance representation representative of the shape of the surface. The processor stage is also arranged to reconstruct electronically the surface shape of the object.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.