Patent · US Active

Systems and methods to test integrated circuits

US8217674B2 · kind B2 · utility

4Cited by

2References

20Claims

0Family size

Assignee

TEXAS INSTRUMENTS INCORPORATED · US

Inventors

Michael G. Amaro · Naperville, US
Yuwei Luo · Lisle, US
John M. Bonfitto · Lemont, US
Michael J. Kane · Oswego, US

Key dates

Filing date	Feb 8, 2010
Grant date	Jul 10, 2012
Priority date	—
Expiry date	Jan 17, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2889
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Open and short systems and methods for testing integrated circuits are disclosed. An example implementation includes engaging an integrated circuit testing module with an integrated circuit testing apparatus, the integrated circuit testing module for receiving an integrated circuit, a first set of contact points, and a second set of contact points; engaging a first probe onto at least one of the contact points of the first set of contact points, controllably engaging at least one of a second probe onto at least one contact pair of the integrated circuit testing module, and providing an electrical stimulus to the integrated circuit testing module.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.