System and a method of determining a position of a scattering/reflecting element on the surface of a radiation transmissive element
US8218154B2 · kind B2 · utility
64Cited by
13References
36Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 29, 2007 |
| Grant date | Jul 10, 2012 |
| Priority date | — |
| Expiry date | Dec 12, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2203/04109
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A system and a method of determining a position of a scattering/reflecting element on a surface of a radiation transmissive element adapted to transport scattered/reflected radiation toward one or more detectors. Radiation having different characteristics or properties is transmitted to different areas of the surface whereby the position of the touch may be determined from the radiation scattered/reflected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.