Mark extension for analysis of long record length data
US8223151B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 25, 2008 |
| Grant date | Jul 17, 2012 |
| Priority date | — |
| Expiry date | Aug 27, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R13/0245
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of analysis of long record length data using mark duration includes displaying together with a portion of the long record length data each mark that identifies a specified feature of interest together with the mark duration. Associated with the mark may be text identifying the feature of interest, measurement values associated with the duration of the mark, or a combination thereof. Multiple sets of marks may be generated for the long record length data, which sets may be combined to generate new marks with duration. The marks also may be filtered to further refine the marks to be displayed according to user specified criteria. In this way analysis of long record length data representing an acquired signal may be readily automated so a user may move from one interesting event to another without having to pan through the long record length data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.