System for alignment measurement for rolling embossed double-sided optical film and method thereof
US8223335B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 1, 2009 |
| Grant date | Jul 17, 2012 |
| Priority date | — |
| Expiry date | Dec 18, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B5/045
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A system for alignment measurement for a rolling embossed double-sided optical film, the system comprising: a first roller with a first brightness enhancement film pattern and a first alignment pattern thereon, a second roller with a second brightness enhancement film pattern and a second alignment pattern thereon; a measuring unit for measuring diffraction patterns in the first alignment region and the second alignment region, respectively; and a control unit electrically connected to the first roller, the second roller and the measuring unit to adjust the relative position between the first roller and the second roller according to the diffraction patterns measured by the measuring unit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.