Inspection apparatus and inspection method
US8224063B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 19, 2008 |
| Grant date | Jul 17, 2012 |
| Priority date | — |
| Expiry date | Sep 25, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30204
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An inspection apparatus and method for precisely detect an amount of misalignment of a component mounted on a panel through an adhesive which contains conductive particles. The inspection apparatus detects an amount of misalignment, from a predetermined mounting position, of a component mounted on a surface of a panel through an ACF, and includes: a visible light camera which captures an image of a panel recognition mark formed on the panel and a component recognition mark formed on the component; an obtaining unit which obtains, from the image captured by the camera, positions of feature points of the respective recognition marks; and a calculation unit which calculates an amount of misalignment of the feature point of the component recognition mark in the image captured by the camera from a predetermined position that is determined using the position of the feature point of the panel recognition mark as a reference.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.