System and method for assembling substantially distortion-free images
US8224121B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 15, 2007 |
| Grant date | Jul 17, 2012 |
| Priority date | — |
| Expiry date | Nov 5, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V5/222
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Exemplary systems and methods are provided for imaging a unit under test. Orientation of an imaging system is determined with a machine vision system, a unit under test is scanned with the imaging system, and the scanned image is processed into a substantially distortion-free image. The scanned image may be processed into a substantially distortion-free image by mapping a scanned image to coordinates determined by the machine vision system. By combining the position and orientation information collected at the time each image pixel is collected, the image can be assembled without distortion by mapping a detector signal to the appropriate image coordinate. Alternately, the scanned image may be processed into a substantially distortion-free image by mapping a scanned image to a predetermined matrix grid of coordinates, identifying distortion in the scanned image, and correcting identified distortion in the scanned image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.