Patent · US Active

Masks and methods of forming the same

US8227149B2 · kind B2 · utility

3Cited by
2References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 18, 2010
Grant dateJul 24, 2012
Priority date
Expiry dateOct 9, 2030

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F1/36
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

Methods of forming masks. According to the methods, a target pattern is set. Generation of a side lobe caused by the target pattern is verified. A preliminary target pattern and a preliminary side lobe pattern are set, in the target pattern and a region where the side lobe is generated, respectively. An interference pattern map using the preliminary target pattern and the preliminary side lobe pattern is created. At least one of regions having a phase identical or opposite to that of a position of the preliminary target pattern in the interference pattern map is set to an interference auxiliary pattern. A mask using the interference auxiliary pattern and the target pattern is formed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.