Methods and apparatus for assay measurements
US8227261B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 2, 2006 |
| Grant date | Jul 24, 2012 |
| Priority date | — |
| Expiry date | Oct 9, 2028 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T436/2575
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and apparatuses for performing assays involving binding material elements with a plurality of bonds over a substantial area of a surface of a resonant device establishing a normalized exposure. The methods and apparatuses also involve controlling an external influence applied to the material elements over a first period of time and measuring a signal during a second period of time that is indicative of the change in the amount of material elements bound to the surface relative to the normalized exposure. In some cases, the measured signals are integrated with respect to time to determine the time averaged amount of material elements bound to the surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.