Eddy current flaw detection probe
US8228058B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 28, 2008 |
| Grant date | Jul 24, 2012 |
| Priority date | — |
| Expiry date | Apr 5, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/9006
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed is an eddy current flaw detection probe that is capable of pressing itself against an inspection target whose curvature varies. A flaw sensor is configured by fastening a plurality of coils to a flexible substrate that faces the surface of the inspection target. A first elastic body is positioned opposite the inspection target for the flaw sensor, is obtained by stacking two or more elastic plates, and has an elastic coefficient that varies in a longitudinal direction. A second elastic body is a porous body positioned between the flexible substrate and the first elastic body. A pressure section is employed to press the first elastic body toward the inspection target.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.