Early Z testing for multiple render targets
US8228328B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 1, 2007 |
| Grant date | Jul 24, 2012 |
| Priority date | — |
| Expiry date | Jun 1, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T15/40
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The current invention involves new systems and methods for computing per-sample post-z test coverage when the memory is organized in multiple partitions that may not match the number of shaders. Shaded pixels output by the shaders can be processed by one of several z raster operations units. The shading processing capability can be configured independent of the number of memory partitions and number of z raster operations units. The current invention also involves new systems and method for using different z test modes with multiple render targets with a single or multiple memory partitions. Rendering performance may be improved by using an early z testing mode is used to eliminate non-visible samples prior to shading.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.