Super critical angle fluorescence scanning system
US8228602B2 · kind B2 · utility
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2References
19Claims
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Key dates
| Filing date | Mar 25, 2010 |
| Grant date | Jul 24, 2012 |
| Priority date | — |
| Expiry date | Feb 8, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/6428
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A scanning system that provides for detection based on supercritical angle fluorescence (SAF) is described. The system provides for the optical coupling of a sample to the scanner in a sandwich structure that uses first and second refractive index matching materials to provide optical coupling through the sandwich arrangement.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.