Test effort estimator
US8230385B2 · kind B2 · utility
4Cited by
5References
24Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Oct 31, 2006 |
| Grant date | Jul 24, 2012 |
| Priority date | — |
| Expiry date | Mar 28, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06Q10/10
- WIPO fieldIT methods for management
- WIPO sectorElectrical engineering
Abstract
A system, method, and computer program product for evaluating the test effort to be provided for functional testing during an application development project is disclosed. The major influencing parameters within testing applications in complex systems are used to compute a test case management effort and a defect effort, those parameters being scope, duration and product quality related, or organization related. A test effort consolidated measurement is generated and provided as a final summary report in a user-friendly format suitable for management analysis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.