Framework for providing metrics from any datasource
US8234240B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 26, 2007 |
| Grant date | Jul 31, 2012 |
| Priority date | — |
| Expiry date | Dec 24, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F16/254
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A metrics generation system provides IT and other computing system metrics from different data sources in a single display. Configuration files containing parameters and instructions are loaded by the system to access different data sources. The metrics generation system retrieves IT system health data, processes and aggregates metrics from the retrieved data and displays the metrics based on user defined parameters and instructions in the configuration files. The metrics generation system is flexible in that it can be changed to extract data from different IT data sources, calculate different metric information having a hierarchy of attribute types and values, and display a variety of metric data in different formats.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.