Method and apparatus for time-of-flight mass spectrometry
US8237112B2 · kind B2 · utility
1Cited by
14References
5Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 16, 2011 |
| Grant date | Aug 7, 2012 |
| Priority date | — |
| Expiry date | Feb 16, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/408
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A method and apparatus for time-of-flight (TOF) mass spectrometry. The apparatus improves the ion focusing properties in an orthogonal direction and permits connection with an orthogonal-acceleration ion source for improvement of sensitivity. The apparatus comprises an ion source for emitting ions in a pulsed manner, an analyzer for realizing a helical trajectory, and a detector for detecting the ions. The analyzer is composed of plural laminated toroidal electric fields to realize the helical trajectory.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.