Method for determining the locations of at least two impacts
US8237676B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 19, 2008 |
| Grant date | Aug 7, 2012 |
| Priority date | — |
| Expiry date | Apr 26, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2203/04808
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for determining the locations of at least two impacts F1 and F2 on a surface using one or more sensors Si, i=1 to n, with n being the number of sensors, and the impacts F1 and F2 generating a signal being sensed by the one or more sensors, wherein each sensor provides a sensed signal si(t), i=1 to n, with n being the number of sensors. To be able to determine simultaneous impacts of different amplitudes the method includes identifying the location x of one impact, and determining a modified sensed signal si′(t) for each sensor in which the contribution due to the identified impact is reduced and which is based on a comparison, in particular a correlation, of each of the sensed signals si(t) and a predetermined reference signal rij(t) corresponding to a reference impact Rj at location j. The method can also be based on couples of sensed signals.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.