Patent · US Active

Electrical over-stress detection circuit

US8238068B2 · kind B2 · utility

17Cited by

8References

21Claims

0Family size

Assignee

Silicon Laboratories Inc. · US

Inventors

Donelson Arthur Shannon · Austin, US
Alan L. Westwick · Austin, US

Key dates

Filing date	Apr 23, 2010
Grant date	Aug 7, 2012
Priority date	—
Expiry date	Oct 20, 2030

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2853
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

In an embodiment, an electrical over-stress (EOS) circuit includes a detection circuit coupled between first and second supply terminals and configured to detect a perturbation in a supply voltage potential between the first and second supply terminals or between a supply voltage potential and a pad voltage of a bond pad. The EOS circuit further includes an alert generation circuit configured to store data indicating an EOS event in response to detecting the perturbation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.