Method and apparatus for characterizing the imperfections of skin and method of assessing the anti-aging effect of a cosmetic product
US8238623B2 · kind B2 · utility
32Cited by
13References
29Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 4, 2006 |
| Grant date | Aug 7, 2012 |
| Priority date | — |
| Expiry date | Apr 18, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30004
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The invention relates to a method and apparatus for characterizing the imperfections of the skin.The apparatus comprises: The invention finds an industrial application in a method of assessing the anti-aging effect of a cosmetic product.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.