Method and system for identifying defects in radiographic image data corresponding to a scanned object
US8238635B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 21, 2008 |
| Grant date | Aug 7, 2012 |
| Priority date | — |
| Expiry date | Jun 8, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30004
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for identifying defects in radiographic image data corresponding to a scanned object is provided. The method includes acquiring radiographic image data corresponding to a scanned object. In one embodiment, the radiographic image data includes an inspection test image and a reference image corresponding to the scanned object. The method includes identifying one or more regions of interest in the reference image and aligning the inspection test image with the regions of interest identified in the reference image, to obtain a residual image. The method further includes identifying one or more defects in the inspection test image based upon the residual image and one or more defect probability values computed for one or more pixels in the residual image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.