Patent · US Active

Optical measuring probe for process monitoring

US8238698B2 · kind B2 · utility

0Cited by

1References

4Claims

0Family size

Assignee

BAYER TECHNOLOGY SERVICES GMBH · DE

Inventors

Stephan Tosch · Winsen (Aller), DE
Reinhard Gross · Dettelbach, DE
Marcus Brand · Dormagen, DE
Hans Tups · Bensberg, DE

Key dates

Filing date	Jul 20, 2007
Grant date	Aug 7, 2012
Priority date	—
Expiry date	Jul 25, 2027

Classification

Technology area (CPC G)Physics
CPC primaryG01N21/8507
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention relates to an optical measurement probe for process monitoring, having a distal end, arranged in the region of a process apparatus, with a light entrance opening, and a proximal end coupled to a spectrometer, wherein a shaft comprising a light-guiding connection between the distal and proximal ends of the measurement probe is arranged between the two ends. The measurement probe is characterized in that the measurement probe has, in its distal region relative to the shaft and/or the proximal end, a reduced external diameter (FIG. 1).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.