System and method of eliminating interference for impurities measurement in noble gases
US8239171B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 28, 2007 |
| Grant date | Aug 7, 2012 |
| Priority date | — |
| Expiry date | Feb 26, 2028 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02C20/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention provides a system and a method of eliminating interference for impurities measurement in noble gases based on emission spectroscopy which provide very stable, sensitive and interference free results. The method mainly relies on the use of a combination of particularly designed means serially connected for cancelling interferences and proper means for correcting linearity issues. The proposed method is particularly advantageous since it offers long-term stability while providing very accurate and reliable results, even at sub-ppb and up to 10,000 ppm levels, whatever the surrounding conditions and the additional impurities that could be present in the gas under analysis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.