Patent · US Active

System, method, and apparatus for distortion analysis

US8239434B2 · kind B2 · utility

0Cited by

13References

17Claims

0Family size

Assignee

LTX Corporation · US

Inventors

Solomon Max · Brookline, US
Christopher Joel Hannaford · South Weymouth, US

Key dates

Filing date	Jul 9, 2008
Grant date	Aug 7, 2012
Priority date	—
Expiry date	Jun 7, 2031

Classification

Technology area (CPC H)Electricity
CPC primaryH03L7/06
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A system, method, and apparatus for distortion analysis is provided. A method in accordance with at least one embodiment of the present disclosure may include receiving a clock frequency at a direct digital synthesizer (DDS) and generating at least one stream of phase numbers via said DDS. The method may further include generating a digital sine wave using, at least in part, said clock frequency and said at least one stream of phase numbers. Of course, additional implementations are also within the scope of the present disclosure.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.