Neutron porosity logging tool using microstructured neutron detectors
US8242436B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 30, 2010 |
| Grant date | Aug 14, 2012 |
| Priority date | — |
| Expiry date | Nov 30, 2030 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49117
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A neutron porosity measurement device uses semiconductor detectors located at different distances from a cavity configured to accommodate a neutron source. Each of the semiconductor detectors includes (i) a semiconductor substrate doped to form a pn junction, and having microstructures of neutron reactive material formed to extend from a first surface inside the semiconductor substrate, and (ii) electrodes, one of which is in contact with the first surface of the semiconductor substrate and another one of which is in contact with a second surface of the semiconductor substrate, the second surface being opposite to the first surface. The electrodes are configured to acquire an electrical signal occurring when a neutron is captured inside the semiconductor substrate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.