Patent · US Active

Method for measuring the roundness of round profiles

US8243284B2 · kind B2 · utility

1Cited by
1References
10Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 1, 2008
Grant dateAug 14, 2012
Priority date
Expiry dateJul 17, 2029

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB21B38/04
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for measuring the roundness profiles moved forward in longitudinal direction inside a rolling mill, using two laser scanners, respectively provided with a light-sensitive sensor and a laser. At least three shadow edges that fit against the round profile to be measured and enclose the round profile to form a polygon are generated and measured and the corresponding tangents are computed. The method includes: a) determining a center (Z0) in the measuring field prior to the measuring operation; b) determining perpendicular lines from the center (Z0) to the tangents and measuring the distance from the center (Z0) to the tangents; c) determining a contour by computing the corner points of the polygon enclosing the round profile; d) positioning a reference circle relative to the contour so that: i) the square shape deviation of the contour relative to this reference circle reaches a minimum; ii) the reference circle represents the smallest possible circle that can fit around the contour, iii) the reference circle represents the largest possible circle that can fit inside the contour; or iv) the reference circle together with a different circle, arranged concentric to the referenc…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.