System and method for automated data analysis and parameter selection
US8244473B2 · kind B2 · utility
1Cited by
25References
18Claims
0Family size
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Key dates
| Filing date | Jul 30, 2007 |
| Grant date | Aug 14, 2012 |
| Priority date | — |
| Expiry date | Oct 3, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V2210/6167
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
System and method for automatic analysis and determination of a parameter. Measurement data are obtained from one or more sensors deployed to measure a desired parameter, the data being associated to identified locations. The measured data are processed to parse out the data obtained with at least one sensor configured to provide a measurement of a selected subsurface parameter and examined to automatically output a value determined to be the most accurate value for the selected parameter from the obtained measurement data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.