Patent · US Active

Thermal inspection systems

US8244488B2 · kind B2 · utility

15Cited by
22References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 25, 2010
Grant dateAug 14, 2012
Priority date
Expiry dateJan 6, 2031

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01M99/002
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A thermal inspection system includes a fluid source configured to supply a warm flow and a cool flow, indirectly or directly, to internal passage(s) of a component. The system includes an imager configured to capture a time series of images corresponding to a transient thermal response of the component to the warm and cool flows. The system further includes at least one flow meter configured to measure the warm and cool flows supplied to the component and a processor operably connected to the imager. The processor determines the transient thermal response of the component around a transition time. The flow supplied to the component switches from the warm flow to the cool flow at the transition time. The processor compares the transient thermal response around the transition time with one or more baseline values or with an acceptable range of values to determine if the component meets a desired specification.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.