ZIF connectors and semiconductor testing device and system using the same
US8248090B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 28, 2009 |
| Grant date | Aug 21, 2012 |
| Priority date | — |
| Expiry date | Dec 26, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01R2201/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A ZIF connector and a semiconductor testing device using the ZIF connectors are provided. The ZIF connector comprises a body portion and a clamping portion. The body portion is a print circuit board provided with circuit patterns, and further comprises a plurality of signal holes disposed on an upper part of the body portion for electrically connecting a plurality of corresponding signal cables, and a plurality of electrical terminals disposed on a lower part of the body portion and arranged on two lateral sides of the body portion for electrically connecting a plurality of corresponding electrical pads of a substrate. The circuit patterns are provided in the body portion to connect to the electrical terminals through the signal holes accordingly. The clamping portion is horizontally extended on one lateral side of the body portion for securing the ZIF connector in a connector board.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.