Capturing reflected light from a sampling surface
US8248613B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 29, 2010 |
| Grant date | Aug 21, 2012 |
| Priority date | — |
| Expiry date | Jul 23, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/55
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A mechanism is disclosed for capturing reflected rays from a surface. A first and second lens aligned along a same optical center axis are configured so that a beam of light collimated parallel to the lens center axis directed to a first side, is converged toward the lens center axis on a second side. A first light beam source between the first and second lenses directs a light beam toward the first lens parallel to the optical center axis. Second light beam source(s) on the second side of the first lens, direct a light beam toward a focal plane of the first lens at a desired angle. An image capturing component, at the second side of the second lens, has an image capture surface directed toward the second lens to capture images of the light reflected from a sample capture surface at the focal plane of the first lens.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.