Method and apparatus for detecting and characterizing an object
US8249329B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 24, 2005 |
| Grant date | Aug 21, 2012 |
| Priority date | — |
| Expiry date | Aug 9, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed are methods and apparatus for automatic optoelectronic detection and inspection of objects, based on capturing digital images of a two-dimensional field of view in which an object to be detected or inspected may be located, analyzing the images, and making and reporting decisions on the status of the object. Decisions are based on evidence obtained from a plurality of images for which the object is located in the field of view, generally corresponding to a plurality of viewing perspectives. Evidence that an object is located in the field of view is used for detection, and evidence that the object satisfies appropriate inspection criteria is used for inspection. Methods and apparatus are disclosed for capturing and analyzing images at high speed so that multiple viewing perspectives can be obtained for objects in continuous motion.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.