Control system for influencing test-environment parameters, method for controlling a microscope system and computer control program for same

US8249727B2 · kind B2 · utility

Assignee

• Carl Zeiss Micromanaging GmbH · DE

Inventors

• Jörg Schaffer · Oebisfelde, DE
• Eugen Wehner · Oettingen, DE

Key dates

• Filing date: Sep 19, 2007
• Grant date: Aug 21, 2012
• Expiry date: Feb 11, 2028

Classification

• Technology area (CPC G): Physics
• CPC primary: G02B21/24
• WIPO field: Optics
• WIPO sector: Instruments

Abstract

A microscope configuration according to an exemplary embodiment includes a microscope system with at least one addressable component and also a control system with a plurality of control modules for influencing a plurality of test-environment parameters in a test chamber of the microscope system. The control modules are configured to be combined in modular manner and to be coupled through an interface unit with a unified bus, through which they are controlled. A control module influencing a test-environment parameter of an incubation system has a control command interface unit configured to receive at least one control command. The control command interface unit couples with a bus. A control device is coupled with the control command interface unit and influences the test-environment parameter based upon the control command. A further interface unit is coupled to the control command interface unit and outputs, again, the received control command.