Correlation of inspection information and computer-aided design data for structural assessment
US8249832B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 5, 2009 |
| Grant date | Aug 21, 2012 |
| Priority date | — |
| Expiry date | Oct 29, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for correlating data is provided. Generally, the system contains a scanning system having at least one inspection emitter. The scanning system situated to scan a structure and produce a quantity of inspection information. A local positioning system is in communication with the scanning system and situated to detect a location of the quantity of inspection information in relation to the structure. A quantity of computer-aided design data corresponding to the quantity of inspection information is included. An imaging system is in communication with the scanning system and the local positioning system, the imaging system situated to produce an overlay image of at least two of an image based from the structure, an image based from the quantity of inspection information and an image formed from at least a portion of the quantity of computer-aided design data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.