Communication unit with analog test unit
US8255183B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 30, 2009 |
| Grant date | Aug 28, 2012 |
| Priority date | — |
| Expiry date | Dec 17, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B17/318
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
Various devices and techniques for testing an analog portion of communication devices are disclosed. Such devices may include a communication unit and an analog test unit. The analog test unit may be configured to test analog portions of the communication unit and communicate information regarding testing to an external test unit. The analog test unit may also be configured to perform an analysis of a test signal that is output by a transmitter portion, looped back to a receiver portion, and subsequently received by the analog test unit. The analog test unit may also be configured to calibrate a DC offset of a receiver chain of the communication unit. The analog test unit may also be configured to perform a nonlinearity test on one or more ADCs and/or DACs of the communication unit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.