Method and apparatus for creating compound due-to reports

US8255246B2 · kind B2 · utility

Assignee

• DemandTec, Inc. · US

Inventors

• Dirk Beyer · Palo Alto, US
• Phillip Dennis Delurgio · Foster City, US
• James Frederic Drew · Redwood City, US
• Nathaniel Keith Folkert · San Francisco, US
• Steven John Peter Hillion · San Francisco, US
• Michael Alexander Shwe · San Francisco, US
• Chad William Whipkey · Foster City, US

Key dates

• Filing date: Oct 31, 2008
• Grant date: Aug 28, 2012
• Expiry date: Dec 18, 2030

Classification

• Technology area (CPC G): Physics
• CPC primary: G06Q30/02
• WIPO field: IT methods for management
• WIPO sector: Electrical engineering

Abstract

Methods and apparatuses for computing a variance between two business metrics is described. In one embodiment, the method computes a variance for each of a first set of activities based on the corresponding reference state of that activity, wherein the variance for an activity is the change in contribution for that activity between the first and second business metrics and with each of the first set of activities having a reference value. Furthermore, the method computes a variance for each of a second set of activities based on the corresponding start and end values of that activity with each of the second set of activities having a start and end value.