Patent · US Active

High resolution label free analysis of cellular properties

US8257936B2 · kind B2 · utility

12Cited by
168References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 9, 2009
Grant dateSep 4, 2012
Priority date—
Expiry dateApr 29, 2030

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N33/54373
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention provides methods of detecting a change in cell growth patterns.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.