System and method for detecting and correcting defective pixels in an image sensor
US8259198B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 20, 2009 |
| Grant date | Sep 4, 2012 |
| Priority date | — |
| Expiry date | Aug 21, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/618
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Various techniques are provided for the detection and correction of defective pixels in an image sensor. In accordance with one embodiment, a static defect table storing the locations of known static defects is provided, and the location of a current pixel is compared to the static defect table. If the location of the current pixel is found in the static defect table, the current pixel is identified as a static defect and is corrected using the value of the previous pixel of the same color. If the current pixel is not identified as a static defect, a dynamic defect detection process includes comparing pixel-to-pixel gradients between the current pixel a set of neighboring pixels against a dynamic defect threshold. If a dynamic defect is detected, a replacement value for correcting the dynamic defect may be determined by interpolating the value of two neighboring pixels on opposite sides of the current pixel in a direction exhibiting the smallest gradient.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.