Pixel array with reduced sensitivity to defects
US8259199B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 12, 2008 |
| Grant date | Sep 4, 2012 |
| Priority date | — |
| Expiry date | Jun 12, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/77
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An array of active pixels comprises rows of pixels and row select lines for selecting rows of pixels. Each active pixel comprises a buffer amplifier for buffering an output of a photo-sensitive element. An output of the buffer amplifier can be selectively put into a high impedance state, by control of the input of the buffer amplifier, when there is a defect in the row select line for that pixel. This allows other rows, which are defect-free, to remain operating as normal. A disable line can be provided for a row of pixels and each pixel can have a switch connected to the disable line. Alternatively, a first supply line powers a row of pixels. Each pixel comprises a reset switch connected between a photo-sensitive element and the first supply line for resetting the photo-sensitive element. The array is configured such that, in the event of a defect in a row select line, the first supply line is set to ground, or a low voltage, and the reset switch is turned on to put the buffer amplifier into the high impedance state.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.