Locating a testable object in a functional testing tool
US8261239B2 · kind B2 · utility
2Cited by
14References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 23, 2003 |
| Grant date | Sep 4, 2012 |
| Priority date | — |
| Expiry date | Jul 9, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3672
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method, system and apparatus for locating a testable object in a functional testing tool is provided. The method can include comparing object properties for a mapped testable object to object properties for each of a set of candidate testable objects organized in a hierarchy, computing an anchor object in the hierarchy, and determining a best matching candidate testable object for the mapped testable object without requiring an exact match of the object properties while constraining the comparing and determining steps with respect to the anchor object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.