Method for analyzing gait pattern
US8261611B2 · kind B2 · utility
14Cited by
5References
5Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 15, 2010 |
| Grant date | Sep 11, 2012 |
| Priority date | — |
| Expiry date | Mar 9, 2031 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B2562/046
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A method for analyzing a gait pattern includes: measuring, by a plurality of force sensing resistor (FSR) sensors, foot pressure values, and outputting the measured foot pressure values, respectively; searching for a maximum pressure local area in which the sum of the output values from the FSR sensors included in each of a plurality of pressure local areas is maximized; calculating a center of pressure (COP) with respect to the detected maximum pressure local area; and analyzing a gait pattern by adding the calculated COP to the trajectory of COPs.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.