Method and system for correcting aberrations of the eye for an ophthalmic instrument
US8262222B2 · kind B2 · utility
1Cited by
8References
21Claims
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Key dates
| Filing date | Aug 18, 2005 |
| Grant date | Sep 11, 2012 |
| Priority date | — |
| Expiry date | Aug 9, 2027 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61F2009/00863
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A method for correcting aberrations of the eye applied to an ophthalmic instrument operating with an analysis light beam, including: measurement of aberrations of the eye capable of interfering with the analysis beam, correction of the phase of the wave front of the analysis beam as a function of the measured values of the aberrations, measurement of eye movements carried out independently of the measurement of aberrations, and modification of the correction of the phase of the wave front of the analysis beam as a function of the measurement of eye movements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.