Patent · US Active

Weir design providing optimal purge gas flow, melt control, and temperature stabilization for improved single crystal growth in a continuous Czochralski process

US8262797B1 · kind B1 · utility

18Cited by
5References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 11, 2008
Grant dateSep 11, 2012
Priority date
Expiry dateMay 26, 2031

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T117/1072
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

A weir is extended vertically to define an optimal annular gap between the top of the weir and the underside of a super-adjacent heat shield. The annular gap provides a high velocity stream of argon gas to be directed from the growth region to the melt region to substantially eliminate the transport of airborne particles from the melt region to the growth region. The tall weir may be configured as a modular, reusable weir extension supportably engaged with an outer (and/or inner) weir.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.