Practical modeling and acquisition of layered facial reflectance
US8264490B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 2, 2009 |
| Grant date | Sep 11, 2012 |
| Priority date | — |
| Expiry date | Feb 13, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V40/16
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Techniques are described for modeling layered facial reflectance consisting of specular reflectance, single scattering, and shallow and deep subsurface scattering. Parameters of appropriate reflectance models can be estimated for each of these layers, e.g., from just 20 photographs recorded in a few seconds from a single view-point. Spatially-varying specular reflectance and single-scattering parameters can be extracted from polarization-difference images under spherical and point source illumination. Direct-indirect separation can be employed to decompose the remaining multiple scattering observed under cross-polarization into shallow and deep scattering components to model the light transport through multiple layers of skin. Appropriate diffusion models can be matched to the extracted shallow and deep scattering components for different regions on the face. The techniques were validated by comparing renderings of subjects to reference photographs recorded from novel viewpoints and under novel illumination conditions. Related geometry acquisition systems and software products are also described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.