Display calibration method and apparatus for exposing errors in gamma mapping and image scaling
US8264547B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 30, 2007 |
| Grant date | Sep 11, 2012 |
| Priority date | — |
| Expiry date | May 10, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2320/0673
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Test patterns and associated techniques for testing the fidelity of intensity reproduction are disclosed. One set of embodiments provide test patterns that incorporate anti-aliased features such as anti-aliased edges or lines. In various embodiments, these anti-aliased features expose undesirable, nonlinear transformations of the test patterns by one or more devices in an image output system or chain. Using these test patterns, users may more easily evaluate the end-to-end gamma response of the system, and may more easily calibrate gamma controls accordingly. Additionally, users may more easily identify nonlinear image resampling performed in gamma, rather than linear, space.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.