Method and system for measuring at least one property including a magnetic property of a material using pulsed laser sources
US8264693B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 8, 2008 |
| Grant date | Sep 11, 2012 |
| Priority date | — |
| Expiry date | Apr 27, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/1284
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of measuring at least one property including a magnetic property of target material is provided. A pump pulse train having one or more pump pulses is generated. The target material is irradiated with at least a portion of the one or more pump pulses so as to cause transient perturbation in the target material. At least one probe pulse train is generated having one or more probe pulses. The target material is irradiated with at least a portion of the one or more probe pulses to obtain one or more reflected probe pulses which are modulated based on the transient perturbation. A time interval between a time at which the target material is irradiated by each of the pump pulses and a time at which the target material is irradiated by each of its corresponding probe pulses is controlled. Each modulated probe pulse is detected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.