Patent · US Active

Device for testing surface mounted connectors

US8269507B2 · kind B2 · utility

9Cited by
10References
12Claims
0Family size

Inventor

Key dates

Filing dateMay 29, 2010
Grant dateSep 18, 2012
Priority date—
Expiry dateMar 12, 2031

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/68
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

This invention describes a device for testing a surface mounted connector using a test probe assembly that utilizes a vacuum to force the test wires and the test probe's wire array into intimate contact with the connector to be tested. The wires are directed through a wire module assembly and have a wide spacing at one end, and a narrow spacing corresponding to the spacing required for the specific units to be tested at the opposite end. The wires are kept in contact with the unit under test by the use of spring loaded test connectors and vacuum.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.