Dual energy imaging system
US8270565B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 7, 2010 |
| Grant date | Sep 18, 2012 |
| Priority date | — |
| Expiry date | Apr 23, 2031 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B6/482
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A dual energy inspection system that generates X-rays with an electron beam scanned over targets. A switchable voltage source that can be change its voltage output may cause X-rays to be generated at different energies. This X-ray generation subsystem is controlled by a sequencer that provides beam steering and shaping control inputs that may be dependent on the voltage provided by the voltage source. In another aspect, the dual energy inspection system may use multiple types of detectors, each sensitive to X-rays of a different energy. A relatively small number of detectors sensitive to one energy level is provided. Nonetheless, dual energy measurements may be made on objects within an item under inspection by identifying points that, for each object of interest, provide a low interference path to one of those detectors. Measurements made with radiation emanating from those points are used for dual energy analysis of those objects.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.